The optics and detector testing capabilities support the missions of the Optics (OPT) and Detectors (DET) groups to develop new technologies as well as to characterize or calibrate optics and detectors produced at other labs and by industry. The beamline primarily serves the testing needs of the OPT and DET groups, but it also has a General User program. Frequent access to a repeatable testing setup is difficult to accommodate at other beamlines set up to serve specific user communities. The flexibility to accommodate different set-ups at 1-BM addresses this need. The beamline provides a wide horizontal beam for monochromatic and white-beam topography of samples up to 100 mm in width. A novel white-beam shutter with millisecond-response allows controlled exposures (as short as 50 msec) for topography. Various conditioning crystals have been fabricated to condition the beam after the monochromator, and sample crystals can then be studied in an overall (+ - - +) x-ray optical configuration. With this crystal configuration rocking curve topography of samples can be done with an optimized narrow angular resolution function. Other optics testing tools and capabilities include 1) a moveable platform for Talbot diffraction grating-based interferometry and speckle tracking for optics wavefront characterization, and 2) a moveable microscope setup for testing zone plates and multilayer Laue lens optics at low and moderate resolution.

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