| Beamlines technical specifications |
CHEX (28-ID-B/C) (technical specs) supports General Diffraction, Surface Scattering, X-ray Photon Correlation Spectroscopy, Coherent Diffraction Imaging and Molecular Beam Epitaxy. CHEX (28-ID-D/E) (technical specs) supports General Diffraction, Surface Scattering, X-ray Photon Correlation Spectroscopy, Coherent Diffraction Imaging and Pulsed Laser Deposition. CHEX (28-ID-F) (technical specs) supports General Diffraction, Surface Scattering, X-ray Photon Correlation Spectroscopy, Coherent Diffraction Imaging and Chemical Vapor Deposition. CHEX (28-ID-G) (technical specs) supports General Diffraction, Surface Scattering, X-ray Photon Correlation Spectroscopy and Coherent Diffraction Imaging. 33-BM Beamline (technical specs) supports General-Purpose Scattering and Diffraction. 3DMN (34-ID-E) (technical specs) supports sub-micron (200 nm-focused beam) scanning 3D Laue microdiffraction. ATOMIC (34-ID-F) (technical specs) supports Coherent Diffraction Imaging. |
| Beamline web-pages |
| Instruments and Tools |
Tabletop SEM Cross section polisher IB-19530CP Sample growth chambers ? |