Research Facilities

Sector 33 Bending Magnet Beamline (33-BM technical specs) supports General-Purpose Scattering & Diffraction.

Sector 33 Insertion Device Beamline (33-ID technical specs) designed and operated for General Purpose Scattering & Diffraction, X-ray Standing Waves, and Surface & Interface Scattering.

Sector 34 Insertion Device Beamline (E station) (34-ID-E technical specs) supports sub-micron Micro Diffraction.

Sector 12 Insertion Device Beamlines (D station) (12-ID-D technical specs)  supports surface diffraction and thin films diffraction.

  (for Coherent X-ray Diffraction at 34-ID-C,  see MIC group beamlines.)