Albert Macrander of the Argonne X-ray Science Division (XSD) has been elected a Fellow of the American Physical Society. The Fellowship citation is for “advancement of x-ray science, x-ray optics, and x-ray measurements on crystals and for his leadership as Editor of the Review of Scientific Instruments.”
As group leader of the Optics Fabrication and Metrology Group in XSD, Macrander guides optics work for APS beamlines; part of this work is on innovative optics. Most recently, these include development of Multilayer Laue Lenses (MLL) and Kirkpatrick-Baez mirrors, both of which have demonstrated nanofocusing of hard x-rays. The MLL is an essential component of the hard x-ray nanoprobe at APS sector 26, one of the tools that will be used by researchers at the Argonne Center for Nanoscale Materials.
Macrander obtained his Ph.D. in physics at the University of Illinois at Urbana-Champaign working on an x-ray lattice expansion study of fcc crystals of the noble gases Ar, Kr, and Xe. He was a postdoctoral associate at Cornell University in materials science working on field-ion microscopy, and then a member of technical staff (MTS) for 10 years at Bell Laboratories in Murray Hill, NJ, before coming to Argonne. He started work at the APS in 1990 working on inelastic x-ray scattering and was promoted to group leader in 1996. He has published over 100 peer-reviewed papers. He co-authored a well-read book on the materials properties of GaAs- and InP-based epitaxial structures. He has co-edited eight conference proceedings and has been awarded two patents.
Macrander is the Head Editor for Review of Scientific Instruments, a journal based at Argonne and published by the American Institute of Physics.