Sector 33: 33-ID-D,E

Introduction
The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, and general scattering and diffraction applications. X-ray reflection interface microscopy (XRIM) is now open to general users.
 
Beamline contacts
NameEmailTelephone
Zhan Zhangzhanzhang@anl.gov630.252.0863
Hawoong Honghhong@anl.gov630.252.0864
Jon Tischlertischler@anl.gov(630) 252-0861