The inaugural Award for Excellence in Beamline Science at the Advanced Photon Source was awarded on May 6, 2013, to Jan Ilavsky, an X-ray Science Division beamline scientist working in partnership with ChemMatCARS, APS sector 15-ID. The award recognizes Ilavsky's work in creating the world-leading APS ultra-small-angle X-ray scattering (USAXS) facility for the exploration of materials-based phenomena in pure and applied science. Under his direction, USAXS has evolved from a "niche" technique to a mainstream capability enabling leading-edge research in static microstructure relationships as well as dynamics. Areas of application include nanoparticle formation, growth, aggregation, and stabilization; correlation of microstructure and properties in thermal barrier coatings, xerogels and aerogels, fuel cells, elastomeric materials and superalloys; and dynamics of particle interactions in previously inaccessible time and size ranges. Publications J. Ilavsky, F. Zhang, A. J. Allen, L. E. Levine, P. R. Jemian, and G. G. Long, "Ultra-Small-Angle X-ray Scattering Instrument at the Advanced Photon Source: History, Recent Development, and Current Status." Metall. Mater. Trans. A 44(1): 68-76 (2013). DOI: 10.1007/S11661-012-1431-Y J. Ilavsky, A. J. Allen, L. E. Levine, F. Zhang, P. R. Jemian, and G. G. Long, "High-energy Ultra-small-angle X-ray Scattering Instrument at the Advanced Photon Source," J. Appl. Crystallogr. 45(6), 1318-1320 (2012). DOI: 10.1107/S0021889812040022 USAXS Resources USAXS at APS: https://usaxs.xray.aps.anl.gov. J. Ilavsky, "Nika: Software for Two-dimensional Data Reduction," J. Appl. Crystallogr. 45(2), 324-328 (2012). DOI: 10.1107/S0021889812004037 J. Ilavsky and P. R. Jemian, "Irena: Tool Suite for Modeling and Analysis of Small-angle Scattering," J. Appl. Crystallogr. 42(2), 347-353 (2009). DOI: 10.1107/S0021889809002222 |