During the 2012R2 beamtime cycle of the Advanced Photon Source, testing and commissioning of new microscope components have been carried out in collaboration with colleagues from the X-ray Microscopy Group (XMG) and the Electronic and Magnetic Devices Group (EMMD) of the Center for Nanoscale Materials. In particular, a novel type of filter for the data acquisition system has been commissioned. The so-called topography-filter allows separating x-ray-induced currents from conventional tunnel currents.