| The paper Synchrotron X-Ray Scanning Tunneling Microscopy: Fingerprinting Near to Far Field Transitions on Cu(111) Induced by Synchrotron Radiation has been selected by Advanced Functional Material as back cover of Vol. 23 No. 20, published in print on May 28, 2013. In this study, the influence of the x-ray illumination on the stability of the tunneling process has been explored. An important finding is that the tip can be lifted out of tunneling, without beeing directly noticed by the STM. | 
|