The Advanced Photon Source (APS) at Argonne organizes an ongoing seminar series, the APS Scientific Computation Seminar Series, focused on various aspects of computation for synchrotron science; talks are related to data analysis, reconstruction, theory, simulation, optimization, machine learning, automation, and visualization. The seminar provides an opportunity to present and learn about state-of-the-art software and the application of computational, AI/ML and mathematical techniques to synchrotron science. |
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Title: | Compressed Sensing-based Data Collection Strategies | Presenter(s): | Dr. James Weng Beamline Scientist X-Ray Science Division, Advanced Photon Source (APS), Argonne National Laboratory | Date: | April 1, 2024 | Time: | 1:00 PM (Central Daylight Savings Time) | Location (hybrid): | Join ZoomGov Meeting https://argonne.zoomgov.com/j/1601444470?pwd=N1phbHZVdCtmcVR5cGh0c1Zhc0… Meeting ID: 160 144 4470 Passcode: 937918 One tap mobile +16692545252,,1601444470# US (San Jose) +16468287666,,1601444470# US (New York) Dial by your location • +1 669 254 5252 US (San Jose) • +1 646 828 7666 US (New York) • +1 646 964 1167 US (US Spanish Line) • +1 669 216 1590 US (San Jose) • +1 415 449 4000 US (US Spanish Line) • +1 551 285 1373 US (New Jersey) Meeting ID: 160 144 4470 Find your local number: https://argonne.zoomgov.com/u/af2crdvQy | Abstract: | With the advent of brighter light sources there are new challenges in data collection. Naively increasing exposure time can easily destroy both the sample and detector, resulting in useless measurements and expensive instrument damage. In the case of disordered materials, where material defects are the information of interest, beam damage (which creates new defects) must be avoided during measurement. Here we present compressed sensing-based measurement strategies, which take advantage of the structured nature of data in order to provide measurements with minimal beam exposure. By leveraging modern signal processing and computing resources, these strategies not only reduce necessary collection time, but also provide less noisy measurements than conventional measurement strategies. |
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