TITLE: The program for nanoscale structure, kinetics and dynamics at APS-U Feature beamline 9-ID, a new home for grazing incidence x-ray scattering from soft matter interfaces
ABSTRACT: Development of the APS-U Feature Beamline CSSI (Coherent Surface Scattering Imaging) at 9-ID will provide a new home and new capabilities for the program in nanoscale structure and kinetics and the grazing Incidence x-ray scattering (GIXS) instrument migrating from 8-ID-E. The APS-U source, a revolver undulator and horizontally deflecting double crystal monochromator will provide highly coherent x-rays tunable over the range from 6-25 keV. Two transfocators can focus the beam to ~ 3 um spot size at the sample. The GIXS diffractometer and infrastructure from 8-ID-E will provide robust, stable sample positioning of horizontally oriented samples with a variety of environments. An in-air area detector mounted on a detector positioning system will capture wide-angle scattering from the sample. A large vacuum flight path allows for distances 3-20 m from the sample to a state-of-the-art in-vacuum pixel array detector for small-angle scattering as well as grazing-incidence x-ray photon correlation spectroscopy (GI-XPCS) to capture the dynamics of thin film materials spanning time scales from 10-3 to 103 seconds. Complementing these hardware developments, high performance computing and open-source software will combine for automated workflows to help users keep up with the accelerated pace of data acquisition. Highlights from the legacy of the GIXS instrument at 8-ID-E, including scattering studies of organic electronics, mixed ionic-electronic conductors and hybrid organic-inorganic materials and devices, will illustrate the vibrancy of the user science program and point the way forward as the program expands at 9-ID to include GI-XPCS and nanoscale dynamics.
Acknowledgments: This work would not be possible without contributions from the 9-ID CSSI beamline development team: Ray Ziegler, Jayson Anton, Sunil Chitra, Miaoqi Chu, Peco Myint, Jonathan Knopp, Luca Rebuffi, Xianbo Shi, Deming Shu, Sunil Bean, Ashish Tripathi, Chasen Wolford, Luis Diaz, Steven Kearney, Kevin Wakefield, Altaf Khan, Dana Capatina, Miaoqi Chu, Peco Myint, Hannah Parraga, Scientific Co-Leads Zhang Jiang and Jin Wang, and Dynamics and Structure group leader Suresh Narayanan. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science user facility at Argonne National Laboratory and is based on research supported by the U.S. DOE Office of Science-Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
About the speaker: Since joining the APS X-ray Science Division in 2008 as an Assistant Physicist in the Time Resolved Research group, Joe Strzalka has supported the program in nanoscale structure and kinetics anchored by the grazing incidence small-angle x-ray scattering (GISAXS) instrument at 8-ID-E. Joe introduced capabilities for grazing incidence wide-angle scattering (GIWAXS) and sample environments for in situ and operando studies that have attracted a thriving user community focused on functional soft matter thin films, especially organic electronics. Joe earned his Ph D in physical chemistry at the University of Pennsylvania working with Prof. Kent Blasie applying x-ray scattering techniques to characterize the structure of synthetic peptide amphiphile thin films. As a post-doc at Penn, Joe was an early user of the liquid surface spectrometer at APS 9-ID CMC-CAT beamline. Currently a Physicist in the Dynamics and Structure group and part of the team developing the new feature beamline at 9-ID, Joe looks forward to returning to where his experience at the APS began and developing new capabilities for grazing incidence scattering to serve the user community in the APS-U era.