Abstract:  
In this presentation we will introduce SenSiC GmbH (https://www.sensic.ch), a new startup located in ParkINNOVARE (Villigen CH), and the latest achievements on the development of Silicon Carbide X-ray sensors for beam monitoring applications (SiC XBPM). Specifically focusing on the on-going activities for the validation of new devices for whitebeam and cross-chromatic monitoring. The new devices could allow for (i) nanosecond dynamic response, (ii) insensitivity to carbon contamination, i.e. absolute measurement capabilities, (iii) insensitivity to the bending magnet background radiation and (iv) negligible beam absorption/interference, even for soft X-rays beamlines, while achieving submicron resolutions and the possibility of fast feedback loop corrections. 

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Meeting ID: 160 904 9608