The Advanced Photon Source
a U.S. Department of Energy Office of Science User Facility

X-ray Spectroscopy Special Interest Group (SIG)

Type Of Event
Meeting
Sponsoring Division
APS
Location
Virtual
Speaker
Bruce Ravel, NIST
Host
Yong Choi and George Sterbinsky
Start Date
03-10-2021
Start Time
10 a.m.
Description
Title: High-throughput, automated glancing angle XAS at NIST's Beamline for Materials Measurement One silver lining of the last 12 months has been a renewed emphasis on beamline automation. At NIST's Beamline for Materials Measurement (BMM), we have remained productive since returning in July by deploying extensive automation for mail-in and remotely operated experiments. Glancing angle XAS is a common experiment at BMM, typically 3 or 4 proposals each cycle request it. For reasons I will discuss, the glancing angle measurement has been difficult to automate. In this talk, I will present a glancing angle XAS stage implemented this cycle at BMM. The new stage holds 8 samples and fully meets the requirements of the glancing angle experiment. I will discuss the design and operation of the new stage, its implementation using BlueSky, and its integration into the user experience at BMM. To join the meeting on a computer or mobile phone: https://bluejeans.com/5975960925?src=calendarLink&flow=joinmeeting Phone Dial-in +1.312.216.0325 (US (Chicago)) +1.408.740.7256 (US (San Jose)) +1.866.226.4650 (US Toll Free) Global Numbers: https://www.bluejeans.com/premium-numbers Meeting ID: 597 596 0925 Room System 199.48.152.152 or bjn.vc Meeting ID: 597 596 0925

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