Type Of Event
Meeting
Sponsoring Division
APS
Location
Virtual
Speaker
Bruce Ravel, NIST
Host
Yong Choi and George Sterbinsky
Start Date
03-10-2021
Start Time
10 a.m.
Description
Title:
High-throughput, automated glancing angle XAS at NIST's Beamline for
Materials Measurement
One silver lining of the last 12 months has been a renewed emphasis on
beamline automation. At NIST's Beamline for Materials Measurement
(BMM), we have remained productive since returning in July by deploying
extensive automation for mail-in and remotely operated experiments.
Glancing angle XAS is a common experiment at BMM, typically 3 or 4
proposals each cycle request it. For reasons I will discuss, the
glancing angle measurement has been difficult to automate. In this
talk, I will present a glancing angle XAS stage implemented this cycle
at BMM. The new stage holds 8 samples and fully meets the requirements
of the glancing angle experiment. I will discuss the design and
operation of the new stage, its implementation using BlueSky, and its
integration into the user experience at BMM.
To join the meeting on a computer or mobile phone: https://bluejeans.com/5975960925?src=calendarLink&flow=joinmeeting
Phone Dial-in
+1.312.216.0325 (US (Chicago))
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Meeting ID: 597 596 0925
Room System
199.48.152.152 or bjn.vc
Meeting ID: 597 596 0925