SXSPM | News Archive | 08.08.2012

11th International Conference on X-ray Microscopy in Shanghai, China (August 8, 2012)

APS APS

The international Conference on X-ray microscopy (XRM) started in Göttingen in 1983. It has been held every third year from 1987, then every second year after 2008, considering its significance and broad interest to X-ray imaging and technique.

The XRM 2012 was held from 5 to 10 August 2012 in Shanghai. The event was organized by the Shanghai Synchrotron Radiation Facility (SSRF) and the National Synchrotron Radiation Laboratory (NSRL). It provided up-to-date information on the theoretical approaches and experimental developments in high resolution X-ray imaging and all techniques devoted to the observation of microstructures using X-rays as a probe.

Our work on combining scanning tunneling microscopy and synchrotron radiation at the APS was presented by Volker Rose.

APS

Left: More than 200 scientists attended the XRM 2012 conference. Right: Shanghai by night provided a spectacular view during the conference reception.

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