SXSPM | News Archive | 06.11.2012

Toward Microscopy with Direct Electronic and Chemical Contrast at the Atomic Level


Speaker: Volker Rose, XSD/MIC
X-ray Science Division Presentation

June 11, 2012
401/A1100 @ 2:00 PM

In this talk we discuss the development of a novel high-resolution microscopy technique for imaging of nanoscale materials with chemical, electronic, and magnetic contrast. It will combine the sub-nanometer spatial resolution of scanning tunneling microscopy with the chemical, electronic, and magnetic sensitivity of synchrotron radiation.