The Metrology Laboratory at the APS can:

  • evaluate optical quality of x-ray mirrors and substrates to be used in the APS beamlines, in order to ensure compliance with the user's specifications in terms of figure error and finish.
  • characterize x-ray mirror-bender assemblies and specialized optics.
  • carry out joint R&D programs to develop new metrology measurement techniques and instrumentation.



R&D Activities

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