Science Contacts
Jonathan Almer
Phone: 630-252-1049
E-mail: almer@aps.anl.gov
Beamline(s): 1ID, 6ID
Areas of Expertise
- high energy x-ray scattering*
- strain/stress measurements*
- texture measurements*
- small-angle scattering*
- 2D diffraction*
- high-energy microfocusing*
- coatings*
- macrostrains*
- bulk metallic glasses*
Notes:
*willing to work with new users in this area
To revise this information, print the page, mark corrections, and fax to the User Office at 630-252-9250.
Data as of 7/22/05