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X-ray specular reflectivity study of a critical binary fluid mixture


L.W. Marschand, M. Brown, L.B. Lurio, B.M. Law, S. Uran, I. Kuzmenko, T. Gog

PHYSICAL REVIEW E
72 (1), 011509-1-011509-5 (July 2005)
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Abstract:
We have used direct inversion of x-ray reflectivity data to extract the liquid-vapor interface composition profile and the related critical scaling function of a binary mixture of dodecane and tetrabromoethane. The mixture was in the one-phase region above its critical point. The results indicate the formation of a monolayer of the lower surface tension component followed by an abrupt change to a mixed composition which gradually relaxes to the bulk composition deep within the fluid.

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