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Beamline 34-ID-C: Microdiffraction, Coherent X-ray Scattering

X-ray Science Division, APS
Materials Science, Physics

Description

Station 34-ID-C provides coherent x-ray scattering capabilities for a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures using dedicated coherent x-ray scattering microscopy.    

At the station E, the facility provides microbeam diffraction technique to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures and deformation processes using dedicated x-ray microbeam diffraction microscopy.    

 

Supported Techniques

  • Coherent x-ray scattering

Beamline Controls and Data Acquisition

UNIX/Linux running EPICS with VME, SPEC.

Detectors

  • CCD camera
  • Scintillation counters
  • Ionization chambers

Additional Equipment

  • Kappa diffractometer (34-ID-C)

Local Contacts

Name ROSS J. HARDER
Phone 630.252.0852
Name STEFAN VOGT
Phone 630.252.3071
Name JORG MASER
Phone 630.252.1091

Beamline Specs

Source

3.3 Undulator (Undulator A)

Monochromator Type

Si (111)

Energy Range

5-15 keV

Resolution (ΔE/E)

1 x 10 -4

Flux (photons/sec)

5 x 109 @ keV

Beam Size (HxV)

Focused

1µm x 1.5µm

Unfocused

.1mm x .1mm

For additional information see:
http://www.aps.anl.gov/Sectors/33_34/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site