« back to Beamlines Directory

Beamline 34-ID-E: Microdiffraction

X-ray Science Division, APS
Materials Science, Physics, Environmental Science, GeoScience

Description

The facility provides microbeam diffraction techniques to a diverse scientific community. The experiments exploit the APS source brilliance to study fundamental materials structures and deformation processes using dedicated 3D x-ray microbeam diffraction microscopy.  

 

Supported Techniques

  • Microdiffraction
  • Laue crystallography
  • Microbeam

Beamline Controls and Data Acquisition

UNIX/Linux running EPICS with VME.  Custom data collection and analysis software for 3D diffraction microscopy

Detectors

  • Amorphous Si area detector (Perkin-Elmer) (2k x 2k)
  • 2 Amorphous Si area detectors (Perkin-Elmer) (1k x 1k)
  • KETEK GmbH AXAS Si drift detector
  • Ionization chambers
  • Roper Scientific PI-SCX:4300 CCD

Additional Equipment

  • Q-distributions with micro beams
  • 3D k-space mapping with micro beams

Local Contacts

Name WENJUN LIU
Phone 630.252.0890
Name RUQING XU
Phone 630.252.0858
Name JONATHAN TISCHLER
Phone 630.252.0861

Beamline Specs

Source

3.3 Undulator (Undulator A)

Monochromator Type

Si(111)

Energy Range

7-30 keV

Resolution (ΔE/E)

1 x 10 -4

Flux (photons/sec)

1 x 109 @15 keV

Beam Size (HxV)

Focused

.3µm x .3µm

Monochromator Type

White Beam

Energy Range

7-30 keV

Flux (photons/sec)

4 x 1011 @ keV

Beam Size (HxV)

Focused

.3µm x .3µm

For additional information see:
http://www.aps.anl.gov/Sectors/33_34/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site