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Beamline 8-ID-E: GIXS, GISAXS, GIWAXS, and XPCS

X-ray Science Division, APS
Materials Science, Polymer Science, Physics

Description

8-ID-E is dedicated to the study of ordering and kinetics at surfaces and interfaces via the technique of grazing incidence x-ray-scattering (GIXS) in both small-angle (GISAXS) and wide-angle (GIWAXS) regimes. 8-ID-E also hosts programs to measure equilibrium dynamics via XPCS at large wave vector transfers and at liquid surfaces.    The GIXS set-up is optimized for high resolution in reciprocal space and provides a variety of time-resolved experiment capabilities such as temperature, solvent annealing and UV curing. X-rays are most often detected using a high speed version of the Pilatus 1M.

 

Supported Techniques

  • Grazing incidence small-angle scattering
  • X-ray photon correlation spectroscopy
  • Intensity fluctuation spectroscopy
  • Grazing incidence diffraction

Beamline Controls and Data Acquisition

VME-based EPICS control system. SPEC (and medm) for experiment control and scripting. Matlab-based data reduction tools.

Detectors

  • Pilatus 1M
  • PI LCX-1300 direct detection CCD

Additional Equipment

  • Solvent annealing cells
  • Variable temperature cells
  • Vacuum environments

Local Contacts

Name ZHANG JIANG (GIXS, Liquid Surface XPCS)
Phone 630.252.3118
Name JOSEPH W. STRZALKA (GIXS, Liquid Surfaces)
Phone 630.252.0283
Name ALEC R. SANDY (Large Q XPCS)
Phone 630.252.0281
Name JIN WANG (GIXS)
Phone 630.252.9125

Beamline Specs

Source

3.3 Undulator (Undulator A)

Monochromator Type

Si(220)

Energy Range

12-12 keV

Resolution (ΔE/E)

5 x 10 -5

Flux (photons/sec)

5 x 1010 @12 keV

Beam Size (HxV)

Unfocused

.8mm x .5mm

Monochromator Type

Si(111)

Energy Range

7.35-7.35 keV

Resolution (ΔE/E)

1 x 10 -4

Flux (photons/sec)

1 x 1012 @7.35 keV

Beam Size (HxV)

Unfocused

.8mm x .5mm

For additional information see:
http://www.aps.anl.gov/Sectors/Sector8/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site