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Beamline 1-BM-B,C: Optics & Detector Testing Beamline

X-ray Science Division, APS
Materials Science, Physics

Description

Beamline 1-BM is used for testing and characterization of optics and detectors. It has both white beam (1-BM-B) and monochromatic beam (1-BM-C) capabilities. In addition, some of the time in 1-BM-B is set aside for energy-dispersive powder diffraction and single crystal Laue measurements.

 

Supported Techniques

  • Optics Testing
  • Detector Testing
  • Topography
  • Talbot grating interferometry for testing of optics
  • Energy dispersive X-ray diffraction
  • White Laue single crystal-diffraction

Detectors

  • Various, from detector pool

Additional Equipment

  • 6-circle Huber diffractometer

Local Contacts

Name ALBERT MACRANDER (Optics)
Phone 630.252.5672
Name JOHN S. OKASINSKI (Energy Dispersive Diffraction)
Phone 630.252.0162
Name NARESH KUJALA (Optics)
Phone 630.252.7490
Name MATTHEW D. MOORE (Detectors)
Phone 630.252.2553
Name ROBERT BRADFORD (Detectors)
Phone 630.252.1683

Beamline Specs

Source

Bending Magnet

Monochromator Type

Si(111) DCM

Energy Range

6-30 keV

Resolution (ΔE/E)

1.5 x 10 -4

Flux (photons/sec)

9 x 1011 @10 keV

Beam Size (HxV)

Unfocused

80mm x 3mm

Monochromator Type

White beam

Energy Range

50-120 keV

For additional information see:
http://www.aps.anl.gov/Sector1/

Current Status:

Operational/Accepting General Users

Access Mode:

On-site