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Michael Wieczorek

Crystal Optics Fabrication Specialist
X-ray Science Division

Argonne National Laboratory
9700 S. Cass Ave
Building 431-Z014

(630) 252-6794 • email


ARGONNE NATIONAL LABORATORY, (2004 to Present),  Crystal Optics Fabrication Specialist

MOTOROLA / AUTOMOTIVE DIV.,  (2003 to 2004), Technical Process Specialist

MOLEX, INC., (2001 to 2003), Process Engineer

NANOVATION TECHNOLOGIES, INC.,  (2000 to 2001), Process Engineer

NORTHWESTERN UNIVERSITY / BIRL, (1987 to 2000), Lead Materials Research Technician

GOULD, INC., (1985 to 1987), Research Assistant

ABBOTT LABORATORIES INC., (1982 to 1985), Process Technician

Selected Publications

Xian-Rong Huang, Quanjie Jia, Michael Wieczorek and Lahsen Assoufid. Continuous X-ray multiple-beam diffraction with primary Bragg angle from 0 to 90&deg. Journal of Applied Crystallography, 47, 1716–1721  (2014).

Michael Wieczorek, Ruben Khachatryan, Yuri Shvyd’ko, Robert H. Smith, Kenichi Iwasaki, Suzanne Miller, Jun Qian, Xianrong Huang, and Lahsen Assoufid. Achieving Optimal Flatness and Surface Roughness Properties for Novel X-ray Optic Structures Formed by Dicing Saws. SPIE  doi: 10.1117/12.928369.

Michael Wieczorek, Xianrong Huang, Jozef Maj, Ray Conley, Jun Qian, Albert Macrander, Cynthia Christensen, John Hodsden, and Ruben Khachatryan, “Assessing the quality of x-ray optic surfaces of Si crystals cut by diamond-wire and rotating-blade sawing techniques”, Advances In X-ray Analysis, Vol. 52, Proceedings of the 57th Annual Conference on Applications of X-ray Analysis [Denver X-ray Conference] and the 8th International Conference on Residual Stresses (ICRS-8), August, 2008.

H.C. Kang, G. B. Stephenson, C. Liu, R. Conley, R, Khachatryan, M. Wieczorek, A.T. Macrander, H. Yan, J. Maser, J. Hiller, and R. Koritala, "Sectioning of multilayers to make a multilayer Laue lens", Rev. Sci. Instrum., April, 2007.

Chian Liu, G. E. Ice, W. Liu, L. Assoufid,  J. Qian, B. Shi, R. Khachatryan, M. Wieczorek, P. Zschack, and J. Z. Tischler, “Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation x-ray focusing”, 18th International Vacuum Congress, Beijing, August, 2010.

Michael Wieczorek, Ruben Khachatryan, Yuri Shvyd’ko, Robert H. Smith, Kenichi Iwasaki, Suzanne Miller, Jun Qian, Xianrong Huang, and Lahsen Assoufid. Achieving optimal flatness and surface roughness properties for novel x-ray optic structures formed by dicing saws, Proceedings of SPIE (Advances in X-Ray/EUV Optics and Components VII), vol. 8502, September 27, 2012.

Bing Shi, Jon M. Hiller, Yuzi Liu, Chian Liu, Jun Qian, Lisa Gades, Michael J. Wieczorek, Albert T. Macrander, Jorg Maser, and Lahsen Assoufid. A unique approach to accurately measure thickness in thick multilayers, The Journal of Synchrotron Radiation, (2012), 19, 425-427.

Yu. V. Shvyd’ko, J. P. Hill, C. A. Burns, D. S. Coburn, B. Brajuskovic, D. Casa, K. Goetze, T. Gog, R. Khachatryan, J.-H. Kim, C. N. Kodituwakku, M. Ramanathan, T. Roberts, A. Said, H. Sinn, D. Shu, S. Stoupin, M. Upton, M. Wieczorek, H. Yavasa. MERIX - next generation medium energy resolution inelastic x-ray scattering instrument at the APS, Journal of Electron Spectroscopy and Related Phenomena, accepted for publication September 10, 2012.

Research Interests

X-ray optic fabrication, sensor and microelectronic device fabrication, and materials analysis.


B.S., University of Phoenix

A.S., Wilbur Wright College

Industrial Electronics Certificate, Coyne Institute


33 years of experience in R&D working for government, industry, and academic institutions. Fabrication of sensor and microelectronic devices and x-ray optics. Managed a materials analysis facility including operation, maintenance and repair of all analytical equipment.

Awards and Honors

Motorola Six Sigma Green Belt, January, 2004.

Argonne Quality and Safety Recognition Award, December, 2008.