1. History
       a. Individual Ion Gage Noise Caused RF Trips
       b. Unnecessary Beam Dumps and Downtime
       c. Vacuum Interlock Required to Prevent Coupler Damage
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2. Vacuum Hardware Configuration
       a. One Ion Gage Per Cavity
       b. Large Conductance Between Cavities
   -
3. Vacuum Performance
       a. 1.0e-9 to 5.0e-9 Torr. Base Pressure
       b. 5.0e-9 to 1.0e-8 Torr. Operating Pressure
       c. Cavity Pressure Interlocked at 5.0e-7 Torr
   -
4. Modification
       a. Tie Interlock Relays in Adjacent Cavities Together
       b. Lower Cavity Pressure Interlock Level to 1.0e-7 Torr
   -
5. Results
       a. No Spurious Ion Gage Vacuum Trips
       b. Improved RF System Reliability
       c. No Noted Damage to Cavity Components
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6. Successfully Implemented in Booster 5-Cell Cavities With Two Gages Per Cavity.

Ion Gage noise during conditioning.  Gage polling interlock logic prevents a spurious power trip